Program overview
The sorting machine is for sorting cells with defects in color or appearance (front and back) and insufficient electrical performance
Our solution
Program Features
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High industry coverage
Achieve the high-speed full inspection and grading of the size, line marks, warpage, surface defects, cracks, electric energy and other characteristics of silicon wafers of various processes such as single crystal and polycrystalline
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High stability
Non-contact “0”damage, sorting and testing
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High efficiency
Automatic collection and real-time upload of detection and sorting data and equipment status data, convenient control and maintenance, high efficiency
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